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3255B SERIES Precision Magnetics Analyzer

3255B SERIES

specyfikacja

Overview

Completely characterize components with comprehensive parametric tests

The 3255B range of inductance analyzers are able to accurately characterise devices in a clear and simple manner. The inductance analyzers are available in three versions 3255BL (200kHz), 3255B (500kHz) and 3255BQ (1 MHz).

At the design stage of component development it is very important to analyse how components performs under different operating conditions. This includes operation over a range of frequencies, AC drive levels or DC bias currents.

The AC drive level can be set between 1 mV and 10 V. DC bias current can be set from 1 mA to 1 A internally (optional). Using the external 3265B range of DC Bias Units bias currents can be set to a maximum of 125 A. 

Printed output of test results

Using the parallel Centronics interface the user can directly print all test results for further analysis and archiving.

In addition, via the optional GPIB interface, the instrument can be controlled from a PC and results can be read back for analysis and storage.

LabVIEW™ drivers are available on request or can be downloaded from the web site, www.waynekerrtest.com, providing a base from which a user can develop a specific test application. 

Bin sort

The binning function allows component manufacturers to sort components in up to ten bins. Sorting is carried out either by absolute values or by percentage of values. 

Component tests with up to 125 A DC bias current

The 3255B and 3255BQ enable components to be measured at up to 125 A when optional 3265B DC Bias Units are used. Extended DC bias capability is also available with the 3255BL which uses the 3265B/5A or 3265B/10A to extend the DC bias current available to a maximum of 50A.

Up to five of the DC Bias Units can be used in parallel to give a wide range of DC bias currents.

Internal DC bias is available as an option giving DC bias currents from 1 mA to 1 A.

The 3265B has a number of safety and protection features including a safety interlock system to protect users against back EMFs. It is also fully protected against over temperature, excess voltage drop and sense lead failure.

SMD inductor tests up to 50 A

With the addition of the 1009 DC Bias Fixture DC bias currents up to 50 A can be applied to an SMD inductor during component test in order to evaluate the devices thoroughly at operational bias currents. The fixture operates with one or two 3265B/25A Wayne Kerr DC bias units and a 3255B Inductance Analyzer. If two 3265B/25As are used then the optional 5-328-2005 high current lead set will be required.

Four rear panel mounted BNC connectors and two captive high current cables ensure simplicity and ease of use with a 3265B.

Interchangeable component test carriers ensure that the 1009 test fixture may be used with a wide variety of different devices. Blank carriers are available which enable device specific test fixtures to be developed or alternatively a carrier design and manufacturing service is available.

Stable component fixturing ensures high accuracy and repeatable measurements. Enclosed fixtures, with safety interlocks, minimises risk to operators.

Key Features

  • 3 models: 3255BL, 3255B, and 3255BQ
  • Wide frequency range (20 Hz to 3MHz)
  • 0.1% basic accuracy
  • Z, L, C, Rac, Ø, Q, D, Rdc & Turns Ratio
  • Internal 1 A DC bias current (option)
  • Up to 125A of DC bias current with 5 x 3265B
  • Bin function (option)
  • Multi-frequency mode
  • Fast measurement speed (up to 20 measurements per second)
  • Straightforward intuitive operation
  • Print test results
  • GPIB control with LabVIEW™ driver

Technical Specification

Measurement Function Z, Ø, L, C, Rac, Rdc, Q, D, turns ratio
Frequency Range 20 Hz to 200 kHz (3255BL) 
20 Hz to 500 kHz (3255B) 
20 Hz to 1 Mhz (3255BQ)
Drive Level Source impedance 50 ?
1 mV to 10V rms into open circuit 
50 µA to 200 mA rms into short circuit 
Automatic Level Control (ALC) maintains level applied to DUT at ±2%, ±1 mV of set voltage or ±2%, ±0.1 mA of set current, reduces to ±4% below 100 Hz.
Internal DC Bias (Option) 1 mA to 1 A
Measurement Speeds 4 speeds selectable (20/sec max)
Measurement Ranges R 0.05 mΩ to > 2 mΩ 
L 1 nH to >1000H 
C 0.01 fF to > 250mF 
Turn Ratio 100:1 to 1:100
Accuracy L/Rac/Z/Cp ±0.1% 
Q ±0.1% (Q+1/Q) 
D ±0.001 (1+ D2
Rdc ±0.5%
Input Specification Power supply 230 V AC ±10% or 115 V AC ±10% (selectable) 
50 to 400 Hz
150VA maximum consumption
Display High contrast monochrome LCD 320 x 240 dot with CFL back lighting
Visible area 115 x 86mm
Viewing angle 45°
Measurement Connections 4 front panel BNC sockets
4-wire (Kelvin) measurements with screen at ground potential
Equivalent circuit symbols on screen

6500B SERIA
6500B SERIA
Precyzyjne pomiary wysokiej częstotliwości w połączeniu z łatwym w użyciu interfejsem graficznym i kolorowym wyświetlaczem o wysokiej rozdzielczości. Wszystkie analizatory mają podstawową dokładność 0,05%, minimalną częstotliwość 5 MHz i maksymalną częstotliwość do 120 MHz w zależności od modelu.
6500P SERIES
6500P SERIES
The 6500P series of high frequency LCR meters include extended test frequency capability, high accuracy and a large high resolution color display
6565 SERIES
6565 SERIES
To evaluate components at currents up to 60 A, the 6565 DC Bias Units are used with the Wayne Kerr 6500B and 6500p models of precision analyzers
6400 SERIES
6400 SERIES
Provide thorough and accurate testing of any passive component to market-leading accuracy
4300 SERIES
4300 SERIES
A range of easy to use LCR meters with comprehensive measurement functions.
Accurate and fast measurements may be made from 20Hz to 1MHz (43100) making the 4300 series the ideal choice for many applications in the test or production environment
3265B SERIES
3265B SERIES
To evaluate components at high currents the 3265B/25A DC Bias Units may be used with either the Wayne Kerr 3255B Inductance Analyzer or the 3260B Precision Magnetics Analyzer. Bias current may be set from 25mA to 25A in steps of 25mA
3260B SERIES
3260B SERIES
Offers all measurement parameters needed for the analysis of magnetic components up to 3MHz including true 4-terminal primary to secondary parameters by using 8 front panel BNC
1EV1006
1EV1006
Remote test fixture for axial, radial or bandoliered components. Complete with cable terminating in four BNC connectors
1EV1505
1EV1505
600 mm extension cable terminated with four BNC connectors at the instrument end and four individual crocodile clips at the component end.
1EV1905A
1EV1905A
The 1905A ead with two sprung needle probes is used to access surface mounted devices on circuit boards and for interfacing to hybrid components and chip components on tape.
1EV1905X
1EV1905X
The 1905X is a 4-2 BNC converter plus lead with two sprung needle probes to access surface mounted devices on circuit boards and for interfacing to hybrid components and chip components on tape.
1EVA40100
1EVA40100
Wayne Kerr Kelvin Clips consist of a 0.6 m cable assembly terminated with four BNC connectors at the analyzer end and a pair of 4-terminal Kelvin clips at the Device Under Test end.
1EVA40120
1EVA40120
Chip component tweezers for contacting leadless devices. The cable is terminated with BNC connectors.
1EVA40150
1EVA40150
The 40150 is a price sensitive version of 1EVA40100 Fine Jaw Kelvin Clips for use with 4300 series LCR Meters
1EVA40180
1EVA40180
600mm extension cable terminated with four BNC connectors at the instrument end and a pair of large jawed Kelvin clips at the component end.
1J1015
1J1015
The 1J1015 Conventional Body 2-Terminal High Current Fixture is used to connect a Wayne Kerr Analyzer (3255B or 3260B) and DC Bias Unit (3265B) system to a conventional body Device Under Test and pass up to 125 A DC bias current.
1J1016
1J1016
The 1J1016 SMD 2-Terminal High Current Fixture is used to connect a Wayne Kerr Analyzer (3255B or 3260B) and DC Bias Unit (3265B) system to a surface mount Device Under Test and pass up to 125 A DC bias current.
1J1020
1J1020
The 1020 Fixture is used with the 6500 series, and when used with the /K Materials Test firmware option allows the permittivity of the Material Under Test (MUT) to be calculated automatically.It allows both the Contacting Electrode and the Non-contacting Electrode Methods to be used up to a maximum frequency of 30 MHz.
1J10324
1J10324
The 10324 fixture makes a 4-terminal measurement to bottom contact surface mount devices and is especially suitable for low impedance devices.
FACTORY VIEW
FACTORY VIEW
MESCO VIEW
MESCO VIEW

Wayne Kerr Electronics jest producentem precyzyjnych urządzeń pomiarowych, uznanym za lidera w swojej dziedzinie i rozpoznawanym za jakość, dokładność i szerokie możliwości swoich urządzeń. Wayne Kerr rozpoczął działalność w roku 1946, w Londynie w Wielkiej Brytanii. W ciągu ostatnich 60 lat firma Wayne Kerr Electronics stała się wiodącym producentem urządzeń do procesów testowych (mierniki LCR, analizatory impedancji, wysokiej częstotliwości analizatory LCR). Zapewnia wsparcie techniczne i serwis swoich urządzeń klientom na całym świecie. W celu usprawnienia obsługi i wsparcia technicznego na polskim rynku firma Wayne Kerr Electronics utworzyła autoryzowany oddział firmy. Poza tym posiada swoje oddziłay na całym swiecie, w kilku krajach Europy, w Stanach Zjednoczonych, Singapurze, Indiach, Japonii, Chinach i na Tajwanie.

adres

Adres:

ul. Lotnicza 108, 80-297 Banino k. Gdańska

telefon

telefon:

+48/58-742-11-27

mail

e-mail:

office@waynekerr.pl